Scan circuit and method

US11726140B2 · kind B2 · utility

Assignee

• STMicroelectronics International N.V. · NL

Inventors

• Venkata Narayanan Srinivasan · Greater Noida, IN
• Shiv Kumar Vats · Greater Noida, IN
• Tripti Gupta · Noida, IN

Key dates

• Filing date: Feb 1, 2021
• Grant date: Aug 15, 2023
• Expiry date: Oct 10, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318586
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In an embodiment, a method for performing scan includes: entering scan mode; receiving a test pattern; applying the test pattern through a first scan chain by asserting and deasserting a scan enable signal to respectively perform shift and capture operations to the first scan chain; while applying the test pattern through the first scan chain, controlling a further scan flip-flop with the first scan chain without transitioning a further scan enable input of the further scan flip-flop; and evaluating an output of the first scan chain to detect faults.