Tripti Gupta
5Patents
1h-index
5Co-inventors
40Inventor score
Filing activity: Jan 10, 2014 → Aug 11, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10151797B2 | Logic built-in self-test (LBIST) with pipeline scan enable launch on shift (LOS) flip-flop circuit | Physics | 2 | Active |
| US11726140B2 | Scan circuit and method | Physics | 1 | Active |
| US9222974B2 | System and method for reducing voltage drop during automatic testing of integrated circuits | Physics | 1 | Active |
| US11680982B2 | Automatic test pattern generation circuitry in multi power domain system on a chip | Physics | 0 | Active |
| US12360161B2 | Scan circuit and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.