Carrier based high volume system level testing of devices with pop structures
US11742055B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 9, 2022 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | Nov 9, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5602
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack; and (c) an array of POP memory devices, wherein each POP memory device is disposed adjacent to a respective DUT in the array of DUTs. Further, the testing apparatus comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.