Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US11808812B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 20, 2021 |
| Grant date | Nov 7, 2023 |
| Priority date | — |
| Expiry date | Sep 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack, and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board. The testing apparatus further comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.