Shielded socket and carrier for high-volume test of semiconductor devices

US11821913B2 · kind B2 · utility

Assignee

• Advantest Test Solutions, Inc. · US

Inventors

• Karthik Ranganathan · San Jose, US
• Samer Kabbani · San Marcos, US
• Gilberto Oseguera · San Jose, US
• Ira Leventhal · San Jose, US
• Koji Miyauchi · San Jose, US
• Keith Schaub · Austin, US
• Amit Kucheriya · South Plainfield, US
• Kotaro Hasegawa · Saitama, JP
• Yoshiyuki Aoki · Osaka, JP

Key dates

• Filing date: Sep 30, 2021
• Grant date: Nov 21, 2023
• Expiry date: Dec 7, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2867
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.