Life expectancy monitoring for memory devices
US11947806B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2021 |
| Grant date | Apr 2, 2024 |
| Priority date | — |
| Expiry date | Oct 19, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/7211
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, and devices for life expectancy monitoring for memory devices are described. A memory device may monitor a parameter of a component of the memory device or the memory device overall, and may determine whether the parameter satisfies a threshold. The parameter may represent or be associated with a lifetime of the component, a level of wear of the component, or an operating parameter violation of the component, or any combination thereof. The memory device may communicate, to a host device, an indication of the parameter satisfying the threshold, and the host device may use the information in the indication to adjust one or more parameters associated with operating the memory device, among other example operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.