Patent · US Active

Read threshold estimation systems and methods using deep learning

US11960989B2 · kind B2 · utility

1Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 24, 2020
Grant dateApr 16, 2024
Priority date
Expiry dateFeb 15, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5632
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A controller estimates optimal read threshold values for a memory device using deep learning. The memory device includes multiple pages coupled to select word lines in a memory region. The controller performs multiple read operations on a select type of page for each word line using multiple read threshold sets, obtains fail bit count (FBC) information associated with each read operation, and determines an optimal read threshold set for each word line based on the FBC information. When optimal read threshold sets for the select word lines are different each other, the controller predicts a best read threshold set using the optimal read threshold sets.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.