Temperature monitoring for memory devices
US11977772B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2021 |
| Grant date | May 7, 2024 |
| Priority date | — |
| Expiry date | Jan 14, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.