Patent · US Active

Measurement of a change in a geometrical characteristic and/or position of a workpiece

US11982521B2 · kind B2 · utility

2Cited by
53References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 2018
Grant dateMay 14, 2024
Priority date
Expiry dateNov 14, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/30
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring a spatial distortion of a target surface (110) of a workpiece (110A). Light is transmitted twice through a reference pattern-generator (104) and impinged upon a workpiece pattern-generator (108). Then, with an optical detector (116), first and second beams formed by the light as a result of interaction with two pattern- generators (104) (106) is acquired to produce a signal characterizing geometry of interference fringes formed at the detector (116) by the first and second beams. Indicia representing at least one of a type and a value of spatial distortion of the target surface (110) is generated and recorded. A system embodying the implementation of the method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.