Adjustment of code rate as function of memory endurance state metric
US11983067B2 · kind B2 · utility
1Cited by
3References
20Claims
0Family size
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Key dates
| Filing date | Aug 29, 2022 |
| Grant date | May 14, 2024 |
| Priority date | — |
| Expiry date | Aug 29, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/1435
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method includes determining, by a processing device, a value of a memory endurance state metric associated with a segment of a memory device in a memory sub-system; determining a target value of a code rate based on the value of the memory endurance state metric, and adjusting the code rate of the memory device according to the target value, wherein the code rate reflects a ratio of a number of memory units designated for storing host-originated data to a total number of memory units designated for storing the host-originated data and error correction metadata.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.