Patent · US Active

Electron gun and electron microscope

US12217928B2 · kind B2 · utility

0Cited by
1References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2020
Grant dateFeb 4, 2025
Priority date
Expiry dateJan 7, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/24557
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The electron gun is provided with a first anode electrode and a second anode electrode to generate an acceleration and deceleration electric field. A lens electric field makes it possible to irradiate a sample with an electron beam emitted from a part outside an optical axis of the photoelectric film without being blocked by a differential exhaust diaphragm. A wide range of electron beams off-optical axis can be used even in a high-brightness photocathode that requires high vacuum. As a result, the photoelectric film and the electron gun can be extended in life, can be stabilized, and can be increased in brightness. Further, it is possible to facilitate a control of emitting electron beams from a plurality of positions on the photoelectric film, a timing control of emitting electron beams from a plurality of positions, a condition control of an electron beam in an electron microscope using electron beams.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.