Inventor · Tokyo, JP

Junichi Katane

21Patents

4h-index

29Co-inventors

59Inventor score

Filing activity: Dec 8, 2004 → Sep 28, 2020

Most-cited inventions

Patent	Title	Area	Cited by	Status
USD687475S1	Electron microscope	General	8	Active
US7755045B2	Scanning electron microscope	Electricity	6	Active
US8294097B2	Charged particle radiation device	Electricity	6	Active
US7511271B2	Scanning electron microscope	Electricity	5	Active
US8026491B2	Charged particle beam apparatus and method for charged particle beam adjustment	Electricity	4	Active
US7154089B2	Scanning electron microscope	Electricity	3	Expired
US10886101B2	Charged particle beam device	Electricity	1	Active
US11170972B2	Scanning electron microscope and method for analyzing secondary electron spin polarization	Electricity	1	Active
US8692195B2	Charged particle radiation device	Electricity	1	Active
US12165828B2	Electron gun and electron beam application apparatus	Electricity	0	Active
US12400827B2	Charged particle beam device	Electricity	0	Active
US11823861B2	Charged particle beam device	Electricity	0	Active
US11756763B2	Scanning electron microscope	Electricity	0	Active
US11430630B2	Charged particle beam apparatus	Electricity	0	Active
US11640897B2	Charged particle beam device	Electricity	0	Active
US7557346B2	Scanning electron microscope	Electricity	0	Active
US9824854B2	Charged particle beam device, image generation method, observation system	Electricity	0	Active
US12217928B2	Electron gun and electron microscope	Electricity	0	Active
US8143573B2	Charged particle beam apparatus	Electricity	0	Active
US11961699B2	Charged particle beam device	Electricity	0	Active
US12431325B2	Sample image observation device and method for same	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.