Metasurface-based imaging system, design method, and detector
US12306424B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2023 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Mar 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B1/002
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A metasurface-based imaging system, a design method, and a detector. In an optical axis direction, the metasurface-based imaging system sequentially comprises: a quadratic-phase-based metasurface structure, consisting of a sub-wavelength unit structure array (1) and a substrate (2), the metasurface structure being a monolayer structure and used for implementing preset phase distribution; and a wavevector filter (3), each position of which is equivalent to one aperture stop, the wavevector filter having a filtering function and having different wavevector modulation effects under different incident angles. The metasurface-based imaging system has the advantages of being ultra-light, ultra-thin, and high in imaging quality, and can achieve large-area, ultra-thin, and large field-of-view imaging detection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.