Patent · US Active

System and method for SEU detection and correction

US12346226B2 · kind B2 · utility

0Cited by

8References

20Claims

0Family size

Assignees

XILINX, INC. · US
Advanced Micro Devices, Inc. · US

Inventors

Kumar Rahul · Andover, US
Santosh Yachareni · San Diego, US
Pierre Maillard · San Jose, US
Mrinmoy Goswami · Hyderabad, IN
Tabrez Alam · Hyderabad, IN
Gokul Puthenpurayil Ravindran · Hyderabad, IN
Md Hussain · Hyderabad, IN
Sanat Kumar Dubey · Hyderabad, IN
John Wuu · Fort Collins, US

Key dates

Filing date	Oct 4, 2023
Grant date	Jul 1, 2025
Priority date	—
Expiry date	Oct 4, 2043

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/1608
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Embodiments herein describe a circuit for detecting a single event upset (SEU). The circuit includes a latch including an output node, a first parity node, and a second parity node and correction circuitry configured to correct a single event upset (SEU) at the output node using the first and second parity nodes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.