Method for co-manufacturing a ferroelectric memory and an OxRAM resistive memory and device co-integrating a ferroelectric memory and an OxRAM resistive memory
US12363918B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2022 |
| Grant date | Jul 15, 2025 |
| Priority date | — |
| Expiry date | Feb 2, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N70/8833
Abstract
A method for co-manufacturing a FeRAM and an OxRAM includes depositing a layer of first electrode carried out identically for a zone Z1 and a zone Z2; depositing a layer of hafnium dioxide-based active material carried out identically for Z1 and Z2; depositing a first conductive layer carried out identically for Z1 and Z2; making a mask at Z2, leaving Z1 free; removing the layer at Z1, with Z2 being protected by the mask; removing the mask at Z2; and depositing a second conductive layer in contact with the layer at Z2 and in contact with the layer at Z1, the material of the layer being chosen to create oxygen vacancies in the active layer and depositing a third conductive layer carried out identically for Z1 and Z2.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.