Patent · US Active

FinFET devices

US12376369B2 · kind B2 · utility

0Cited by
32References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2023
Grant dateJul 29, 2025
Priority date
Expiry dateFeb 28, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/834
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

FinFET devices and processes to prevent fin or gate collapse (e.g., flopover) in finFET devices are provided. The method includes forming a first set of trenches in a semiconductor material and filling the first set of trenches with insulator material. The method further includes forming a second set of trenches in the semiconductor material, alternating with the first set of trenches that are filled. The second set of trenches form semiconductor structures which have a dimension of fin structures. The method further includes filling the second set of trenches with insulator material. The method further includes recessing the insulator material within the first set of trenches and the second set of trenches to form the fin structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.