Dynamic read calibration
US12431215B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2023 |
| Grant date | Sep 30, 2025 |
| Priority date | — |
| Expiry date | Apr 5, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system includes a memory device with multiple cells and a processing device to perform operations including: identifying a group of wordlines, each connected to a subset of cells, and assigning a specified charge loss classification value to that group. The operations can also include selecting a page level, selecting a first set of cells, determining, for the first set of cells, a value of a first data state metric, identifying a second set of cells charged to a specified charge state, and determining a value of a second data state metric. The operations can also include maintaining a skew counter of the second data state metric, identifying and updating a read reference voltage offset, as well as applying the updated read reference voltage offset in a read operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.