Patent · US Expired

Dry development of photoresist

US4882008A · kind A · utility

42Cited by
2References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 8, 1988
Grant dateNov 21, 1989
Priority date
Expiry dateJul 8, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/265
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for developing a photolithographic pattern on the surface of an exposed workpiece in a process chamber; disposing the workpiece in a process chamber; heating the workpiece and introducing a silylating agent to the process chamber and to a face of the workpiece to be processed; generating activated species from a source of oxygen; and introducing the activated species to the face of the workpiece.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.