Patent · US Expired

Wafer transport method

US5562800A · kind A · utility

50Cited by
2References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 1994
Grant dateOct 8, 1996
Priority date
Expiry dateSep 19, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/935
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A wafer transport method includes the steps of preparing a semiconductor process equipment having a transport chamber and a process chamber. An interface means connects the transport chamber to the process chamber. A transport means transports a semiconductor wafer from the transport chamber to the process chamber by way of the interface means. The transport means mounting a substrate is inserted into a communicating corridor including a supply means and an exhaust means. The substrate is transported while performing the supply and exhaust by sequentially controlling a supply shutoff means, an exhaust shutoff means, and a communicating shutoff means according to the position of a conductance part formed of a gap between the transport means and the communicating corridor. Thus, the substrate is transported at a high throughput without contamination of the substrate while keeping the different atmospheric conditions for the transport chamber and the process chamber, thereby manufacturing a semiconductor device with high performance capabilities.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.