Patent · US Expired

Method for production of silicon wafer and apparatus therefor

US5679212A · kind A · utility

40Cited by
5References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1995
Grant dateOct 21, 1997
Priority date
Expiry dateSep 28, 2015

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B7/228
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The work of grinding of a silicon wafer is carried out in an etchant containing no loose abrasive and permitting selective etching of deformed layers existent in the surface part of said wafer. The removal of the deformed layers and the heavy metals from the wafer is effected simultaneously and quickly owing to the execution of the work of grinding in the etchant and the consequent synergism of the work of grinding and etching.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.