Patent · US Expired

Inductively and multi-capacitively coupled plasma reactor

US5710486A · kind A · utility

85Cited by
3References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 8, 1995
Grant dateJan 20, 1998
Priority date
Expiry dateMay 8, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/321
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The invention is embodiment in a plasma reactor for processing a semiconductor wafer, the reactor having a pair of parallel capacitive electrodes at the ceiling and base of the processing chamber, respectively, each of the capacitive electrodes capacitvely coupling RF power into the chamber in accordance with a certain RF phase relationship between the pair of electrodes during processing of the semiconductor wafer for ease of plasma ignition and precise control of plasma ion energy and process reproducibility, and an inductive coil wound around a portion of the chamber and inductively coupling RF power into the chamber for independent control of plasma ion density. Preferably, in order to minimize the number of RF sources while providing independent power control, the invention includes power splitting to separately provide power from a common source or sources to the pair of electrodes and to the coil.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.