Patent · US Expired

Method of making a power switching trench MOSFET having aligned source regions

US5897343A · kind A · utility

84Cited by
6References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 30, 1998
Grant dateApr 27, 1999
Priority date
Expiry dateMar 30, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/127

Abstract

A trench power switching transistor (10) is fabricated having sub-micron features on a body layer (26) without using sub-micron lithography. An opening in a field oxide layer (28) defines an area for implanting a source region (30) in the body layer (26) that is self-aligned to a first edge (28A) and a second edge (28B) of the field oxide layer (28). Sidewall spacers (32) are formed in accordance with the first and second edges (28A and 28B) of the field oxide layer (28). A trench is aligned to the sidewall spacers (32) and formed centered within the source region (30). An implant layer (42) formed between sections of the power switching transistor (10) is aligned to the sidewall spacers (32) at the first and second edges (28A and 28B).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.