Testing parameters of an electronic device
US6104651A · kind A · utility
27Cited by
5References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 22, 1999 |
| Grant date | Aug 15, 2000 |
| Priority date | — |
| Expiry date | Nov 22, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/401
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for testing an electronic device includes causing the device to perform an operation. Using circuitry of the device, a duration of time is asynchronously measured in association with the step of causing. The operation is controlled in response to the expiration of the duration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.