Inventor · Boise, ID, US

Timothy B. Cowles

142Patents
21h-index
55Co-inventors
93Inventor score

Filing activity: Feb 24, 1994 → Feb 7, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US5508638A Low current redundancy fuse assembly Electricity 118 Expired
US5729504A Continuous burst edo memory device Physics 105 Expired
US5946265A Continuous burst EDO memory device Physics 98 Expired
US5959929A Method for writing to multiple banks of a memory device Physics 96 Expired
US6128237A Method and apparatus for enhancing the performance of semiconductor memory devices Physics 84 Expired
US6556497B2 Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMs Physics 48 Expired
US5424672A Low current redundancy fuse assembly Electricity 46 Expired
US5999481A Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals Physics 44 Expired
US10297307B1 Methods for independent memory bank maintenance and memory devices and systems employing the same Physics 38 Active
US5940315A Strapped wordline architecture for semiconductor memory Physics 34 Expired
US6026042A Method and apparatus for enhancing the performance of semiconductor memory devices Physics 32 Expired
US6552596B2 Current saving mode for input buffers Electricity 32 Expired
US6049502A Method for writing to multiple banks of a memory device Physics 29 Expired
US11069393B2 Apparatuses and methods for controlling steal rates Physics 28 Active
US6104651A Testing parameters of an electronic device Physics 27 Expired
US6144593A Circuit and method for a multiplexed redundancy scheme in a memory device Physics 27 Expired
US6269035A Circuit and method for a multiplexed redundancy scheme in a memory device Physics 26 Expired
US6904552B2 Circuit and method for test and repair Physics 25 Expired
US6212114A Methods of identifying defects in an array of memory cells and related integrated circuitry Physics 23 Expired
US6535439B2 Full stress open digit line memory device Physics 21 Expired
US11158364B2 Apparatuses and methods for tracking victim rows Physics 21 Active
US6278648A Method for writing to multiple banks of a memory device Physics 21 Expired
US6650584B2 Full stress open digit line memory device Physics 20 Expired
US5945840A Low current redundancy anti-fuse assembly Electricity 20 Expired
US6864725B2 Low current wide VREF range input buffer Electricity 19 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.