Patent · US Expired

Apparatus for electro-chemical deposition with thermal anneal chamber

US6136163A · kind A · utility

440Cited by
46References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 1999
Grant dateOct 24, 2000
Priority date
Expiry dateMar 5, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67098
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention generally provides an electro-chemical deposition system that is designed with a flexible architecture that is expandable to accommodate future designs rules and gap fill requirements and provides satisfactory throughput to meet the demands of other processing systems. The electro-chemical deposition system generally comprises a mainframe having a mainframe wafer transfer robot, a loading station disposed in connection with the mainframe, a rapid thermal anneal chamber disposed adjacent the loading station, one or more processing cells disposed in connection with the mainframe, and an electrolyte supply fluidly connected to the one or more electrical processing cells. One aspect of the invention provides a post electrochemical deposition treatment, such as a rapid thermal anneal treatment, for enhancing deposition results. Preferably, the electro-chemical deposition system includes a system controller adapted to control the electro-chemical deposition process and the components of the electro-chemical deposition system, including the rapid thermal anneal chamber disposed adjacent the loading station.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.