Patent · US Expired

Flip-chip semiconductor device with enhanced reliability and manufacturing efficiency, and the method for under filling the same

US6153939A · kind A · utility

15Cited by
2References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 1999
Grant dateNov 28, 2000
Priority date
Expiry dateMay 24, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/351
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A flip-chip semiconductor device and a method for under filling the flip-chip semiconductor device are disclosed. The flip-chip semiconductor device is provided with a substrate and a die having a plurality of solder bumps for connecting to the substrate. Encapsulation material is under filled between the die and the substrate. The substrate has a non-mask area defied in a center portion thereof while the remaining surface area is covered by a solder mask. The non-mask area defines a hole in the center thereof so that the encapsulation material can be dispensed along all sides of the die to flow toward the non-mask area and stop when reaching the non-mask area whereby the encapsulation material does not block the hole and air between said die and the substrate is limited in a void formed around the hole and communicated with the atmosphere via the hole.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.