Patent · US Expired

Multi state sensing of NAND memory cells by varying source bias

US6188606A · kind A · utility

3Cited by
7References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 6, 1999
Grant dateFeb 13, 2001
Priority date
Expiry dateAug 6, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/5642
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and circuit for sensing multi states of a NAND memory cell by varying source bias, at a constant gate voltage, preferably zero volts, generating a memory cell current in response to the source bias, and sensing the memory cell state.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.