Patent · US Expired

MRAM device including digital sense amplifiers

US6188615A · kind A · utility

123Cited by
4References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 1999
Grant dateFeb 13, 2001
Priority date
Expiry dateOct 29, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/1693
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Resistance of a selected memory cell in a Magnetic Random Access Memory ("MRAM") device is sensed by a read circuit including a direct injection charge amplifier, an integrator capacitor and a digital sense amplifier. The direct injection charge amplifier supplies current to the integrator capacitor while maintaining an equipotential voltage on non-selected memory cells in the MRAM device. As the direct injection charge amplifier applies a fixed voltage to the selected memory cell, the sense amplifier measures integration time of a signal on the integrator. The signal integration time indicates whether the memory cell MRAM resistance is at a first state (R) or a second state (R+.DELTA.R).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.