Patent · US Expired

Chemical vapor deposition systems and methods for depositing films on semiconductor wafers

US6214123A · kind A · utility

1Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 1998
Grant dateApr 10, 2001
Priority date
Expiry dateAug 20, 2018

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/4584
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

The present disclosure relates to a chemical vapor deposition system including a chemical vapor deposition chamber, and a circlet wafer positioned within the chemical vapor deposition chamber. The circlet wafer is mounted on a rotatable member that at least partially extends through an opening of the wafer. A drive mechanism is used to rotate the rotatable member and the circlet wafer. The system also includes a gas injector for injecting reactive gases toward the circlet wafer. The present disclosure also relates to a chemical vapor deposition system including a chemical vapor deposition chamber, a wafer positioned within the chemical vapor deposition chamber, and a gas injector for injecting first and second reactive gases toward the wafer. The gas injector includes a mixing region for mixing the first and second reactive gases before the first and second reactive gases are discharged from the gas injector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.