Patent · US Expired

Method to fabricate a high coupling flash cell with less silicide seam problem

US6232635A · kind A · utility

8Cited by
7References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 6, 2000
Grant dateMay 15, 2001
Priority date
Expiry dateApr 6, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

An article and method of manufacturing a semiconductor flash cell. The method includes producing an isolation formation layer on a silicon substrate, forming an oxide on the isolation formation layer, growing a tunnel oxide layer thereon, depositing a first poly silicon layer, masking and etching the first poly silicon layer, depositing a second poly silicon layer and performing a blanket etch back step, forming an oxide/nitride/oxide layer forming a third poly-silicon layer and depositing a silicide layer thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.