Patent · US Expired

Flash memory cell

US6272047A · kind A · utility

56Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 1999
Grant dateAug 7, 2001
Priority date
Expiry dateDec 17, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/12
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A flash memory cell comprises a gate, a drain, a source, a floating gate, and a control gate. The flash memory cell is capable of being programmed by inducing a voltage drop of between about four volts and six volts across a deep-depletion region by applying a first voltage to the gate, a second voltage to the drain, and a third voltage to the source. During a programming operation, the channel current is approximately zero, and the first voltage is ramped at a rate proportional to the injection current.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.