Patent · US Expired

Method of forming vertical planar DMOSFET with self-aligned contact

US6277695A · kind A · utility

33Cited by
3References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 16, 1999
Grant dateAug 21, 2001
Priority date
Expiry dateApr 16, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/665

Abstract

The metal contact to the source and body regions in a vertical planar DMOSFET is formed by fabricating a sidewall spacer on the gate of the MOSFET. With the metal contact self-aligned to the gate in this way, the lateral dimension of each of the cells in the DMOSFET can be significantly reduced without the risk of a short between the contact and the gate, and the packing density of the cells can be increased. In this way, significant reductions in the on-resistance of the device can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.