Method of forming vertical planar DMOSFET with self-aligned contact
US6277695A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 16, 1999 |
| Grant date | Aug 21, 2001 |
| Priority date | — |
| Expiry date | Apr 16, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/665
Abstract
The metal contact to the source and body regions in a vertical planar DMOSFET is formed by fabricating a sidewall spacer on the gate of the MOSFET. With the metal contact self-aligned to the gate in this way, the lateral dimension of each of the cells in the DMOSFET can be significantly reduced without the risk of a short between the contact and the gate, and the packing density of the cells can be increased. In this way, significant reductions in the on-resistance of the device can be achieved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.