Patent · US Expired

Minimizing transistor size in integrated circuits

US6287953A · kind A · utility

9Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 29, 2000
Grant dateSep 11, 2001
Priority date
Expiry dateFeb 29, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/259
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating a field effect transistor (FET) in and on a semiconductor substrate with local interconnects to permit the formation of minimal space between gate and the local interconnects by fabricating the source and drain of the FET and the local interconnects prior to forming the gate of the FET.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.