Vertical bipolar transistor including an extrinsic base with reduced roughness, and fabrication process
US6316818A · kind A · utility
16Cited by
7References
3Claims
0Family size
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Key dates
| Filing date | Jun 1, 1999 |
| Grant date | Nov 13, 2001 |
| Priority date | — |
| Expiry date | Jun 1, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/177
Abstract
The vertical bipolar transistor includes an SiGe heterojunction base formed by a stack of layers of silicon and silicon-germanium resting on an initial layer of silicon nitride extending over a side insulation region surrounding the upper part of the intrinsic collector. The stack of layers also extends on the surface of the intrinsic collector which lies inside a window formed in the initial layer of silicon nitride.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.