Method and structure for reducing contact aspect ratios
US6365453B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 1999 |
| Grant date | Apr 2, 2002 |
| Priority date | — |
| Expiry date | Jun 16, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10B12/312
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
An intermediate metal plug is used to raise the platform to which contact is to be made. In the illustrated process, a partial bit line plug is formed adjacent a stacked capacitor, and an interlevel dielectric formed over the capacitor. The bit line contact is completed by extending a via from the bit line, formed above the interlevel dielectric, down to the level of the intermediate plug, and the via is filled with metal. The height of the via to be filled is thus reduced by the height of the intermediate plug. In one embodiment, the intermediate plug is slightly shorter than an adjacent container-shaped capacitor. In another embodiment, the intermediate plug is about as high as an adjacent stud capacitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.