Patent · US Expired

Method and apparatus for electrochemical-mechanical planarization

US6379223B1 · kind B1 · utility

97Cited by
35References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 1999
Grant dateApr 30, 2002
Priority date
Expiry dateNov 29, 2019

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/042
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method for performing electrochemical-mechanical planarization (EMP) of a workpiece surface including a pattern of electrical conductors comprises supplying a chemical-mechanical polishing (CMP)-type apparatus having an abrasive or non-abrasive polishing pad with an oxidizer-free, electrolytically conductive, abrasive or non-abrasive fluid and applying a time-varying anodic potential to the workpiece surface for controllably dissolving the material, e.g., metal, of the electrical conductors while simultaneously applying mechanical polishing action to the surface. The method advantageously reduces or substantially eliminates undesirable dishing characteristic of conventional CMP planarization processing utilizing chemical oxidizer agent(s). Apparatus for performing EMP are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.