Patent · US Expired

Apparatus and method for improving film uniformity in a physical vapor deposition system

US6471831B2 · kind B2 · utility

8Cited by
16References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2001
Grant dateOct 29, 2002
Priority date
Expiry dateJan 9, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3405
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A PVD system comprises a hollow cathode magnetron with a downstream plasma control mechanism. The magnetron has a hollow cathode with a non-planar target and at least one electromagnetic coil to generate and maintain a plasma within the cathode. The magnetron also has an anode located between the cathode and a downstream plasma control mechanism. The control mechanism comprises a first, second and third electromagnetic coil beneath a mouth of the target, vertically spaced so as to form a tapered magnetic convergent lens between the target mouth and a pedestal of the magnetron.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.