Apparatus and method implementing repairs on a memory device
US6477662B1 · kind B1 · utility
10Cited by
13References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2000 |
| Grant date | Nov 5, 2002 |
| Priority date | — |
| Expiry date | Jan 25, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/72
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An on-chip testing device separately locates must-repairs or preferred-repairs in a row direction and column direction of a memory array. A row counter and a column counter are operated to index the memory array in row-major order, and then in column-major order (or vice versa). A running total of the number of failures is kept for each row and column, when the running total equals or exceeds a predetermined value, the row or column is determined to be a must-repair or a preferred repair. Rows to be repaired are substituted with redundant memory rows and columns to be prepared are substituted with redundant memory columns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.