Eugene H. Cloud
89Patents
33h-index
38Co-inventors
88Inventor score
Filing activity: Jun 20, 1988 → Apr 28, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6570248B1 | Structure and method for a high-performance electronic packaging assembly | Electricity | 310 | Expired |
| US6281042A | Structure and method for a high performance electronic packaging assembly | Electricity | 239 | Expired |
| US5990566A | High density semiconductor package | Electricity | 223 | Expired |
| US6756576B1 | Imaging system having redundant pixel groupings | Electricity | 156 | Expired |
| US5110754A | Method of making a DRAM capacitor for use as an programmable antifuse for redundancy repair/options on a DRAM | Electricity | 149 | Expired |
| US7129457B2 | Redundant imaging systems | Electricity | 136 | Expired |
| US6356500B1 | Reduced power DRAM device and method | Physics | 114 | Expired |
| US5324681A | Method of making a 3-dimensional programmable antifuse for integrated circuits | Electricity | 106 | Expired |
| US6249460A | Dynamic flash memory cells with ultrathin tunnel oxides | Physics | 89 | Expired |
| US5155067A | Packaging for a semiconductor die | Electricity | 87 | Expired |
| US6002613A | Data communication for memory | Physics | 85 | Expired |
| US6032264A | Apparatus and method implementing repairs on a memory device | Physics | 83 | Expired |
| US5907512A | Mask write enablement for memory devices which permits selective masked enablement of plural segments | Physics | 83 | Expired |
| US6380581B1 | DRAM technology compatible non volatile memory cells with capacitors connected to the gates of the transistors | Electricity | 77 | Expired |
| US5724288A | Data communication for memory | Physics | 72 | Expired |
| US5910921A | Self-test of a memory device | Physics | 68 | Expired |
| US6456535B2 | Dynamic flash memory cells with ultra thin tunnel oxides | Physics | 65 | Expired |
| US5146308A | Semiconductor package utilizing edge connected semiconductor dice | Electricity | 65 | Expired |
| US6373740B1 | Transmission lines for CMOS integrated circuits | Electricity | 64 | Expired |
| US5714802A | High-density electronic module | Electricity | 64 | Expired |
| US6906408B2 | Assemblies and packages including die-to-die connections | Electricity | 61 | Expired |
| US5653619A | Method to form self-aligned gate structures and focus rings | Electricity | 59 | Expired |
| US6521958B1 | MOSFET technology for programmable address decode and correction | Electricity | 59 | Expired |
| US5815427A | Modular memory circuit and method for forming same | Electricity | 56 | Expired |
| US6525413B1 | Die to die connection method and assemblies and packages including dice so connected | Electricity | 55 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.