Patent · US Expired

Ceramic electrostatic chuck assembly and method of making

US6483690B1 · kind B1 · utility

99Cited by
28References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2001
Grant dateNov 19, 2002
Priority date
Expiry dateJun 28, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6833
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A sintered ceramic electrostatic chucking device (ESC) which includes a patterned electrostatic clamping electrode embedded in a ceramic body wherein the clamping electrode includes at least one strip of a sintered electrically conductive material arranged in a fine pattern. Due to the fineness of the electrode pattern employed, stresses induced during manufacture of the ESC are reduced such that the clamping electrode remains substantially planar after the sintering operation. The resulting ESC allows for improved clamping uniformity. Another ESC includes an insulating or semi-conducting body and a clamping electrode having a high resistivity and or a high lateral impedance. The electrostatic chucking device provides improved RF coupling uniformity when RF energy is coupled thorough the clamping electrode from an underlying RF electrode. The RF electrode can be a separate baseplate or it can be a part of the chuck. The ESC's may be used to support semiconductor substrates such as semiconductor wafers in plasma processing equipment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.