Jitter measurement apparatus and its method
US6525523B1 · kind B1 · utility
9Cited by
6References
24Claims
0Family size
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Key dates
| Filing date | Nov 24, 2000 |
| Grant date | Feb 25, 2003 |
| Priority date | — |
| Expiry date | Nov 24, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal under measurement is transformed into a complex analytic signal using Hilbert transformation to estimate an instantaneous phase of the signal under measurement from the complex analytic signal. A zero-crossing timing sequence of the signal under measurement is estimated using the instantaneous phase. An instantaneous period sequence of the signal under measurement is estimated from the zero-crossing timing sequence to obtain a jitter of the signal under measurement from the instantaneous period sequence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.