Patent · US Expired

ROM embedded DRAM with bias sensing

US6545899B1 · kind B1 · utility

32Cited by
22References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 12, 2001
Grant dateApr 8, 2003
Priority date
Expiry dateDec 12, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/104
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A ROM embedded DRAM that provides ROM cells that can be programmed to a single state. Bias techniques are used to read un-programmed ROM cells accurately. Sense amplifier circuitry can be offset in one embodiment to default to the un-programmed state. In another embodiment, bias circuitry is coupled to bit lines to favor the un-programmed state. Further, a differential pre-charge operation can also be used in another embodiment. The ROM embedded DRAM allows for simplifier fabrication and programming of the ROM cells, while providing accurate dual state functionality.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.