Casey Kurth
62Patents
14h-index
21Co-inventors
84Inventor score
Filing activity: Jul 6, 1995 → Jun 23, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6781867B2 | Embedded ROM device using substrate leakage | Electricity | 37 | Expired |
| US6281131A | Methods of forming electrical contacts | Emerging Cross-Sectional Technologies | 37 | Expired |
| US6834022B2 | Partial array self-refresh | Physics | 36 | Expired |
| US5627478A | Apparatus for disabling and re-enabling access to IC test functions | Physics | 36 | Expired |
| US6545899B1 | ROM embedded DRAM with bias sensing | Physics | 32 | Expired |
| US5732033A | Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing | Physics | 29 | Expired |
| US6130834A | Circuit for programming antifuse bits | Physics | 28 | Expired |
| US9269858B2 | Engineered substrates for semiconductor devices and associated systems and methods | Electricity | 26 | Active |
| US6134137A | Rom-embedded-DRAM | Electricity | 26 | Expired |
| US6243285A | ROM-embedded-DRAM | Electricity | 24 | Expired |
| US7440255B2 | Capacitor constructions and methods of forming | Electricity | 20 | Expired |
| US5689455A | Circuit for programming antifuse bits | Physics | 18 | Expired |
| US6192446A | Memory device with command buffer | Physics | 17 | Expired |
| US6055173A | Circuit for programming antifuse bits | Physics | 14 | Expired |
| US5721703A | Reprogrammable option select circuit | Physics | 14 | Expired |
| US6785167B2 | ROM embedded DRAM with programming | Physics | 11 | Expired |
| US6137737A | Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing | Physics | 11 | Expired |
| US6826071B2 | Circuit for programming antifuse bits | Physics | 10 | Expired |
| US6445605B1 | Circuit for programming antifuse bits | Physics | 10 | Expired |
| US6903991B2 | Circuit for programming antifuse bits | Physics | 9 | Expired |
| US6735108B2 | ROM embedded DRAM with anti-fuse programming | Physics | 9 | Expired |
| US6255837A | Apparatus and method disabling and re-enabling access to IC test functions | Physics | 9 | Expired |
| US6650587B2 | Partial array self-refresh | Physics | 9 | Expired |
| US6160413A | Apparatus and method for disabling and re-enabling access to IC test functions | Physics | 8 | Expired |
| US7366946B2 | ROM redundancy in ROM embedded DRAM | Physics | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.