Data processing device test apparatus and method therefor

US6546513B1 · kind B1 · utility

Assignee

• Advanced Micro Devices, Inc. · US

Inventors

• Richard Wilcox · West Orange, US
• Jason Mulig · Austin, US
• David H. Eppes · Austin, US
• Michael R. Bruce · Austin, US
• Victoria J. Bruce · Austin, US
• Rosalinda M. Ring · Austin, US
• Edward I. Cole, Jr. · Albuquerque, US
• Paiboon Tangyunyong · Albuquerque, US
• Charles F. Hawkins · Albuquerque, US
• Arnold Louie · Cupertino, US

Key dates

• Filing date: Jun 2, 2000
• Grant date: Apr 8, 2003
• Expiry date: Jan 31, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/307
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.