Patent · US Expired

Memory chip having a test mode and method for checking memory cells of a repaired memory chip

US6639856B2 · kind B2 · utility

1Cited by

3References

7Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Peter Beer · Waldshut-Tiengen, DE
Carsten Ohlhoff · Hersbruck, DE

Key dates

Filing date	May 30, 2002
Grant date	Oct 28, 2003
Priority date	—
Expiry date	May 30, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/24
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The memory chip has regular memory cells and standby memory cells for replacing faulty memory cells. There is provided a method for checking memory cells of a repaired memory chip, where the memory cells are checked by putting the memory chip into the state before repair. This actuates the memory cells identified as being faulty in spite of the provision of standby memory cells. This allows the operability of the memory chip to be checked after the repair procedure has been carried out. It is thus possible to identify, by way of example, whether a fault has been produced by the repair procedure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.