Apparatus for and method of measuring a jitter
US6687629B1 · kind B1 · utility
20Cited by
10References
22Claims
0Family size
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Key dates
| Filing date | Sep 29, 1999 |
| Grant date | Feb 3, 2004 |
| Priority date | — |
| Expiry date | Sep 29, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A clock waveform XC(t) is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a varying term &Dgr;&phgr;(t). A difference between the maximum value and the minimum value of the varying term &Dgr;&phgr;(t) is obtained as a peak-to-peak jitter, and a root-mean-square of the varying term &Dgr;&phgr;(t) is calculated to obtain an RMS jitter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.