Patent · US Expired

Method of fabricating a trench-structure capacitor device

US6693016B2 · kind B2 · utility

11Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 3, 2002
Grant dateFeb 17, 2004
Priority date
Expiry dateSep 3, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/038

Abstract

The novel trench capacitors have a constant or increased capacitance. Materials for a second electrode region and if appropriate a first electrode region include a metallic material, a metal nitride, or the like, and/or a dielectric region is formed with a material with an increased dielectric constant. An insulation region is formed in the upper wall region of the trench after the first electrode region or the second electrode region has been formed, by selective and local oxidation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.