Patent · US Expired

Memory architecture with memory cell groups

US6724026B2 · kind B2 · utility

6Cited by
3References
13Claims
0Family size

Assignees

Inventors

Key dates

Filing dateSep 19, 2002
Grant dateApr 20, 2004
Priority date
Expiry dateSep 19, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B53/30
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An improved cell design for series memory architecture is disclosed. The improved cell design facilitates the formation of capacitors using a single etch process instead of two, as conventionally required. In one embodiment, each capacitor of a capacitor pair is provided with at least one plug contacting a common diffusion region of two adjacent cell transistors. In another embodiment, a large plug with sufficient overlap to the bottom electrodes of pair of capacitors is used.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.