Patent · US Expired

Method and apparatus for facilitating process-compliant layout optimization

US6745372B2 · kind B2 · utility

220Cited by
21References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 5, 2002
Grant dateJun 1, 2004
Priority date
Expiry dateApr 5, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

One embodiment of the invention provides a system that simulates effects of a manufacturing process on an integrated circuit to enhance process latitude and/or reduce layout size. During operation, the system receives a representation of a target layout for the integrated circuit, wherein the representation defines a plurality of shapes that comprise the target layout. Next, the system simulates effects of the manufacturing process on the target layout to produce a simulated printed image for the target layout. The system then identifies problem areas in the simulated printed image that do not meet a specification. Next, the system moves corresponding shapes in the target layout to produce a new target layout for the integrated circuit, so that a simulated printed image of the new target layout meets the specification.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.