Patent · US Expired

Multilayer structure with controlled internal stresses and making same

US6756285B1 · kind B1 · utility

43Cited by
10References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2002
Grant dateJun 29, 2004
Priority date
Expiry dateJan 9, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/31678
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A multilayer structure with controlled internal stresses comprising, in this order, a first main layer (110a), at least a first constraint adaptation layer (130) in contact with the first main layer, at least a second stress adaptation layer (120) put into contact by adhesion with said first stress adaptation layer, and a second main layer (110b) in contact with the second stress adaptation layer, the first and second stress adaptation layers having contact stresses with the first and second main layers.Application to the realization of electronic circuits and membrane devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.